Mass spectrometry of molecular neutrals sputtered from amino acid overlayers on Au and Ni |
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| Institution: | 1. Division of Analytical Chemistry, Department of Chemistry, BOKU – University of Natural Resources and Life Sciences, Muthgasse 18, 1190 Vienna, Austria;2. Department of Chemistry, Faculty of Science, University of Zagreb, Horvatovac 102a, 10000 Zagreb, Croatia;3. Center for Analytical Chemistry, Department of Agrobiotechnology, IFA-Tulln, University of Natural Resources and Life Sciences in Vienna, Konrad-Lorenz-Str. 20, 3430 Tulln, Austria |
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| Abstract: | Mass spectrometry of electron post-ionized sputtered neutrals (e-beam SNMS) is a useful new surface mass spectrometry, complementary to secondary ion (SIMS) and thermal desorption (TDMS) mass spectrometry. This is demonstrated by applying these three techniques to identical mono- and multimolecular overlayers of glycine on the metal (Me) substrates Ni and Au. In particular the molecular neutrals M0 and (M + Me)o supply new information about the sputtering process, and show the analytical potential of e-beam SNMS for quantitative molecular surface analysis. |
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