The use of peak intensity in diffraction measurements of growth kinetics on surfaces |
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| Affiliation: | 1. Department of Advanced Organic Materials and Textile System Engineering, Chungnam National University, Daejeon 34134, Republic of Korea;2. Samsung Advanced Institute of Technology, Samsung Electronics Company, Ltd., Suwon 16678, Republic of Korea;3. Global Technology Center, Samsung Electronics Company, Ltd., Suwon 16678, Republic of Korea;1. Department of Energy Conversion and Storage, Technical University of Denmark, DK-4000, Roskilde, Denmark;2. Department of Chemistry and Nanoscience Center, University of Copenhagen, Universitetsparken 5, DK-2100, Copenhagen Ø, Denmark;3. Siemens Gamesa Renewable Energy, Diplomvej 378, DK-2800, Lyngby, Denmark;1. Shaanxi Key Laboratory of Macromolecular Science and Technology, School of Chemistry and Chemical Engineering, Northwestern Polytechnical University, Xi’an, Shaanxi 710072, PR China;2. Research & Development Institute of Northwestern Polytechnical University in Shenzhen, Shenzhen, Guangdong 518057, PR China;3. Shaanxi Coal Chemical Industry Technology Research Institute Co. Ltd, Xi’an, Shaanxi 710070, PR China;1. Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Jahnstraße 12, A-8700 Leoben, Austria;2. School of Natural Sciences, Far Eastern Federal University, 690950 Vladivostok, Russia;3. Institut für Materialwissenschaft, Technische Universität Darmstadt, Otto-Berndt-Str. 3, D-64287 Darmstadt, Germany;4. WPI Advanced Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Sendai 980-8577, Japan;5. Mathematics for Advanced Materials-OIL, National Institute of Advanced Industrial Science and Technology (AIST), Sendai 980-8577, Japan;6. Department of Mechanical and Aerospace Engineering, University of Central Florida, Orlando, FL 32816-2450, USA;7. National University of Science and Technology “MISiS”, Moscow 119049, Russia;8. Department of Materials Science & Metallurgy, University of Cambridge, Cambridge CB3 0FS, UK;9. Department Materials Physics, Montanuniversität Leoben, Jahnstraße 12, Leoben A-8700, Austria |
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| Abstract: | It is shown that the peak intensity in a diffracted beam can be related to growth kinetics on surfaces only if scaling is obeyed. When scaling is obeyed, the peak intensity is in general related to the square of the average domain size, and not to the fourth power. The finite resolving power of the instrument distorts growth kinetics measurements, giving an apparent growth rate that is less than the actual one. |
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