Reionization contributions in low-energy scattering of He,Ne and Ar ions from Sn,Au, and BaTiO3 |
| |
| Institution: | 1. Department of Solid State Physics, University of Debrecen, P.O. Box 400, H-4002 Debrecen, Hungary;2. Nano-Science & Semiconductor Laboratories, Department of Physics, Faculty of Education, Ain Shams University, Cairo 11566, Egypt;3. Physics Department, Faculty of Science and Art, Al Jouf University, Al-Qurayyat, Saudi Arabia;4. Institute of Materials Science, University of Stuttgart, Heisenbergstraße 3, D-70569 Stuttgart, Germany;5. Center of X-Ray Analytics, Empa, Swiss Federal Laboratories for Materials Science and Technology, Überlandstrasse 129, CH8600 Dübendorf, Switzerland |
| |
| Abstract: | The proportion of reionized neutrals to the total scattering yield of rare-gas ions is reported for primary energies E0 from 0.1 to 2.0 keV. The measurements were made for several ion-target combinations by comparing the ion yield obtained from incidence of ions with that obtained from incidence of neutrals. The ration of the reionized neutrals to the total ion yield is strongly dependent on the combination of projectile ion and target atom. In some combinations, e.g. Ne on Sn for E0 > 1 keV and Ar on Ba for E0 > 0.5 keV, the reionized neutrals constitute the main part of the total ion yield, while the proportion of reionized Ne0 scattered from Au is very small and increases gradually with increasing E0. |
| |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ |
|
