Effect of longitudinal applied magnetic field on the self-pinched critical current in intense electron beam diode |
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Authors: | Liu Guo-Zhi Huang Wen-Hu Shao Hao and Xiao Ren-Zhen |
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Institution: | Xi'an Jiaotong University, Xi'an 710049, China; Northwest Institute of Nuclear Technology, Xi'an 710024, China |
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Abstract: | The effect of applied longitudinal magnetic field on the
self-pinched critical current in the intense electron beam diode is discussed.
The self-pinched critical current is derived and its validity is tested by
numerical simulations. The results shows that an applied longitudinal magnetic field
tends to increase the self-pinched critical current. Without the effect of
anode plasma, the maximal diode current approximately equals the
self-pinched critical current with the longitudinal magnetic field
applied; when self-pinched occurs, the diode current approaches the
self-pinched critical current. |
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Keywords: | intense electron beam diode self-pinched current |
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