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基于集成电路测试系统的大功率资源板设计
引用本文:季常珊,王斌,陈剑晟.基于集成电路测试系统的大功率资源板设计[J].电子测试,2010(1):44-47.
作者姓名:季常珊  王斌  陈剑晟
作者单位:集成电路测试技术研究中心,BJAST,北京自动测试技术研究所
摘    要:介绍了基于集成电路测试系统的大功率资源板设计,该设计具有输出功率大、限压限流保护、检验诊断、校准的特点,其主要包括闪存与大功率精密测量单元电路。它既可作为电压源、电流源,又可作为电压表、电流表,在作为源施加的同时完成电压或电流的测量。

关 键 词:闪存  大功率精密测量单元  检验  校准

Design of the high power resource plate based on the integrated circuit test system
Ji Changshan,Wang Bin,Chen Jiansheng.Design of the high power resource plate based on the integrated circuit test system[J].Electronic Test,2010(1):44-47.
Authors:Ji Changshan  Wang Bin  Chen Jiansheng
Institution:Ji Changshan,Wang Bin,Chen Jiansheng(Center of IC test Technology,BJAST,Beijing Intstitute of Auto-Testing Technology,Beijing,100088)
Abstract:The paper introduces the design of the high power resource plate based on the integrated circuit test system .It has the high power output,the protection of the limited voltage and current,checking,the automatic calibration characteristic,it mainly includes the flash and the high power precision measurement unit electric circuits.It both may take the voltage source or the current source,and may take the voltmeter or the galvanometer,while it takes the source the voltage or the electric current is surveyed.
Keywords:flash  the high power precision measurement unit  checking  calibration  
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