首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Detection limits of electron and electron capture negative ionization-mass spectrometry for aldehydes derivatized with o-(2,3,4,5,6-pentafluorobenzyl)-hydroxylamine hydrochloride
Authors:Josef Beránek  Darrin A Muggli  Alena Kubátová
Institution:1. Department of Chemistry, University of North Dakota, 151 Cornell Street Stop 9024, 58202, Grand Forks, ND, USA
2. Department of Chemical Engineering, University of North Dakota, Grand Forks, North Dakota, USA
Abstract:In contrast to common expectations, the differences in limits of detection (LODs) between electron capture negative ionization (ECNI) and electron ionization (EI) mass spectrometry (MS) were found to be insignificant for a wide range of aldehydes derivatized with o-(2,3,4,5,6-pentafluorobenzyl)-hydroxylamine hydrochloride. Comparison of the two ionization methods based on LOD confidence intervals revealed that a traditional presentation of the LOD or limit of quantitation (LOQ) as a single value may over/underestimate the significance of obtained results. LODs were between 20 and 150 pg injected for the majority of tested derivatized carbonyls using both ionization methods. ECNI-MS improved LODs by ~10- to 20-fold only for two derivatized aldehydes, 4-hydroxybenzaldehyde and 5-(hydroxymethyl)furfural. Selectivity of ECNI did not appear to be beneficial when analyzing a wood smoke particulate matter (WS-PM) extract, possibly because the majority of interferences were removed during sample preparation (i.e., liquid-liquid extraction). The impact of four different data acquisition modes of transmission quadrupole (TQ)-MS on LODs and their precisions was also investigated. As expected, LODs in the selected ion monitoring (SIM) were ~two to four times lower than those obtained using total ion current (TIC) mode. More importantly, TQ-MS in the selected ion-total ion (SITI) mode (i.e., acquiring SIM and TIC data in a single analysis) provided signal-to-noise ratios and precisions, which were comparable to SIM alone.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号