a Laboratoire de Physique des Solides du CNRS 1, Place A. Briand, F-92195, Meudon Cédex, France
b Laboratoire d'Electrochimie Interfaciale du CNRS 1, Place A. Briand, F-92195, Meudon Cédex, France
Abstract:
An electrolytic method is used to introduce hydrogen into p-type silicon, at room temperature. The results of SIMS analysis indicate that hydrogen diffuses more rapidly in highly doped samples than in low doped samples, in contrast with the results of plasma annealing. The electrochemical technique creates a large number of surface defects, probably related to the existence of a thin hydrogenated layer beneath the surface.