|
|||||
|
|
Measurement of parallelism of the surfaces of a transparent sample |
|
| Authors: | J C Bhattacharya |
| Abstract: | An interferometric method for the measurement of parallelism of the end faces of a transparent material is described. It is based on the measurement of fringe displacement caused by the wedge angle of the material by using the Lau effect. |
| Keywords: | Parallelism Lau effect Interferometry Gratings Refractive index Laser rod Optics |
| 本文献已被 ScienceDirect 等数据库收录！ | |