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Employing a Cerenkov detector for the thickness measurement of X-rays in a scattering background |
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| Authors: | LI Shu-Wei KANG Ke-Jun WANG Yi LI Jin LI Yuan-Jing ZHANG Qing-Jun |
| Affiliation: | 1 Department of Engineering Physics, Tsinghua University, Beijing 100084, China2 Key Laboratory of Particle ＆ Radiation Imaging (Tsinghua University), Ministry of Education, Beijing 100084, China 3 Nuctech Company Limited, Beijing 100084, China) |
| Abstract: | X-ray, environmental scattering background, Cerenkov detector, thickness measurement |
| Keywords: | X-ray environmental scattering background Cerenkov detector thickness measurement |
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