抗辐射加固封装国产存储器的电子辐照试验

用特种复合屏蔽材料和缝焊封接工艺进行抗辐射封装，在普通封装存储器28C256的基础上，研制了抗辐射封装加固存储器LS28C256R。设计专用试验测试电路板和测试软件，以进行存储器器件加电工作条件下电子加速器辐照试验的动态测试。辐照对比试验结果表明，加固存储器LS28C256R的抗电子源辐照能力比普通封装存储器28C256提高1～2个数量级，为商用成品（Commercial Off-The—Shelf，COTS）器件在空间领域中的应用提供了技术支撑。

Electron irradiation test of anti-irradiation hardened package for home-made memory devices

Radiation hardened packages were prepared by using special composite shielding material and welding technique. Hardened package memory LS28C256R was fabricated based on general package memory 28C256. Special experimental testing circuit and testing software were designed to dynamically test memory devices using linear electron accelerator. The result of contrastive irradiation test indicated that the performance of the hardened package memory LS28C256 in anti-electron irradiation was 1-2 orders of magnitude higher than that of the general package memory. This hardened package method had provided technical support for the space application of Commercial Off-The-shelf（COTS） devices.