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电子束辐照对氟掺杂二氧化锡导电玻璃的影响
引用本文:史成武,戴松元,王孔嘉,隋毅峰,方霞琴.电子束辐照对氟掺杂二氧化锡导电玻璃的影响[J].合肥工业大学学报(自然科学版),2005,28(3):324-327.
作者姓名:史成武  戴松元  王孔嘉  隋毅峰  方霞琴
作者单位:中国科学院,等离子体物理研究所,安徽,合肥 230031;合肥工业大学,化学工程学院,安徽,合肥 230009;中国科学院,等离子体物理研究所,安徽,合肥 230031
基金项目:国家重点基础研究发展规划资助项目(G2000028200)
摘    要:运用XRD分析氟掺杂二氧化锡导电玻璃导电面SnO2的晶型,发现其属于四方晶系,晶粒尺寸为32.35nm。运用XPS分析氟掺杂二氧化锡导电玻璃导电面的元素组成主要是Sn和O,未能检测出F。进一步研究表明,电子束辐照前后Sn所处的化学状态相同(以Sn4+的形式存在),O以2种化学状态存在,分别对应氧充足和氧缺乏状态,且随着电子束辐照注量的增加,会有少量的氧失去而使氧充足状态的O1s逐渐减少。

关 键 词:二氧化锡  电子束  XPS  太阳电池
文章编号:1003-5060(2005)03-0324-04
修稿时间:2004年6月23日

Effect of electron beam irradiation on F-doped SnO2 conducting glass
SHI Cheng-Wu,DAI Song-Yuan,WANG Kong-Jia,SUI Yi-Feng,FANG Xia-qin.Effect of electron beam irradiation on F-doped SnO2 conducting glass[J].Journal of Hefei University of Technology(Natural Science),2005,28(3):324-327.
Authors:SHI Cheng-Wu  DAI Song-Yuan  WANG Kong-Jia  SUI Yi-Feng  FANG Xia-qin
Institution:SHI Cheng-wu~~
Abstract:The phase of SnO__2 on F-doped SnO_2 conducting glass was characterized by X-Ray diffraction technique(XRD), and the results show that the phases of SnO_2 belong to the tetragonal system and its average diameter is 32.35 nm.The chemical composition was analyzed by X-ray photoelectron spectroscopy(XPS),and the experiment results indicate that the main compositions of the glass surface are Sn and O and the element F has not been found. It is further found out that Sn exists in the same chemical state of Sn~~(4+)for both unirradiated and irradiated samples,that two types of O can be distinguished by Gaussian fitting,which are corresponding to the oxygen sufficient region and the oxygen deficient region respectively,and that the oxygen sufficient region(O__(1s)) decreases with the increase of electron beam irradiation flux.
Keywords:SnO_2  electron beam  X-ray photoelectron spectroscopy(XPS)  solar cell
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