X-ray analysis of ZnO nanorods grown by microwave irradiation heating on ZnO films |
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Authors: | K Ogata K Koike S Sasa M Inoue M Yano |
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Institution: | Nanomaterials Microdevices Research Center, Osaka Institute of Technology, Osaka 535-8585, Japan |
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Abstract: | Utilizing microwave irradiation heating, 100-nm-diameter ZnO nanorods were grown from aqueous solution on sputtered ZnO films on glass substrates. Its out-of-plane X-ray diffraction (XRD) measurement indicated that the ZnO nanorods were grown with c-axis orientation, similar with the underlying ZnO films. In the in-plane XRD measurement, intensity of the ( ) diffraction was comparable with that of the ( ) one, suggesting their intensity ratio would contain useful information on nanorods density. |
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Keywords: | ZnO nanorods X-ray diffraction |
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