Novel method for determining stacking disorder degree in hexagonal graphite by X-ray diffraction

The broadening effect of stacking disorder in hexagonal graphite is found experimentally by XRD to be identical to that of stacking faults in hexagonal-closed-packing (HCP) structure, which has obvious selective broadening effect. The Langford’s method for dealing with the twofold broadening effects of the crystallite-faults in hexagonal ZnO has been extended in this paper, and then applied to the determination of stacking disorder in 2H-graphite, which indicates that our extension method is convenient to both the experiments and data process, and may be generalized further. Two stacking disorder model in 2H-graphite and data processing method have been proposed in this study. The two disorder degrees of P _AB and P _ABC can be computed when the two reliable FWHMs of 101 and 102 diffraction peaks were obtained. Supported by the National Natural Science Foundation of China (Grant No. 20773157)