Use of short-wavelength synchrotron radiation to measure luminescence quantum yield and the luminescence excitation spectrum of polymers |
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Authors: | S. N. Ivanov E. Yu. Loktionov Yu. S. Protasov Yu. Yu. Protasov |
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Affiliation: | 1.Kurchatov Synchrotron Radiation and Nanotechnology Center,Moscow,Russia;2.N. é. Bauman Moscow State Technical University,Moscow,Russia |
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Abstract: | We describe an optical diagnostics module and the instrumental and methodological features of ultrahigh vacuum experiments investigating the optical characteristics of condensed media in the short-wavelength (hv ~ 3.5–25 eV) range of the spectrum of probing synchrotron radiation. We give a brief presentation of the results of an experimental determination of the spectral dependence of the luminescence quantum yield and the luminescence excitation spectrum of ablatable polymer dielectrics on the Kurchatov synchrotron radiation source at values of the probing radiation power density (I 0 ~ 1012 photons/cm2∙sec) that are below threshold for extended surface vaporization and a surface temperature of the condensed targets equal to 77–300 K. |
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