Study of some optical properties of evaporated TbCu0.6Al0.4 thin films

Evaporated TbCu_0.6Al_0.4 thin films with different thicknesses, ranging from 26 to 100 nm, were prepared on a glass substrate. The complex refractive index of thin films has been determined for the first time from the measurements of reflectance, R, and transmittance, T, at almost normal incidence in the spectral range of 400–2200 nm. Some micro-characteristics of TbCu_0.6Al_0.4 alloy including free charge concentration, n_c, the relaxation time, τ, the static conductivity, σ, and the electron velocity at the Fermi surface, V_F, have been evaluated using the simplified Drude model.