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Parameter measurement of the cylindrically curved thin layer using low-frequency circumferential Lamb waves
Authors:Chen Xiao  Wan Mingxi
Institution:Department of Biomedical Engineering, School of Life Science and Technology, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China.
Abstract:The characteristic parameters of a cylindrically curved thin layer include its elastic constants, thickness and curved radius. A layer is considered thin if the echoes from the front and back surfaces of the layer cannot be separated in the time domain, and/or that the wave arrivals corresponding to longitudinal and shear wave part cannot be identified in the time or space domain. This paper describes a low-frequency circumferential Lamb wave method to characterize those parameters of a cylindrically curved thin layer. The technique is based on the measurement of circumferential Lamb wave phase velocity and the unknown parameter is estimated through minimizing the mean square error obtained by comparing theoretical and experimental phase velocities. The sensitivity and accuracy of the proposed technique to different parameters are analyzed. Using the present technique, a cylindrically curved thin layer with thickness down to ten percent of the longitudinal wavelength can be successfully measured with an average relative error less than two-percent in our experiment.
Keywords:43  35  Cg  43  35  Yb
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