Variations of surfactant monolayer surface density in induced steady wave regime

Fluctuations of an insoluble surfactant concentration along the free liquid surface induced by steady surface waves are considered theoretically. The energy of a waved surface is assumed to consist of surface tension, curvature, and van der Waals energy components. Dependencies of the surface tension and the bending stiffness versus the surfactant concentration are assumed to be linear relative to some reference level. The van der Waals energy is taken in the form of interaction term for a thin film. Minimization of the total energy allows the expression for the deviations of concentration to be obtained. The distribution of a surfactant concentration relative to some reference level has been found to be periodic, with a period that is half of the wave period, and the amplitude of oscillations is a function of a wave number that is very similar to the Landau expansion of the free-energy near the critical point in phase transitions.