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可靠性指标增长验证统计方案设计方法
引用本文:魏川,康锐,王文雨. 可靠性指标增长验证统计方案设计方法[J]. 电子产品可靠性与环境试验, 2013, 0(6): 28-31
作者姓名:魏川  康锐  王文雨
作者单位:北京航空航天大学可靠性与系统工程学院,北京100191
摘    要:在验收试验之前,在产品的研制过程中往往已有不少对产品的其他信息,比如产品各个阶段的试验信息;在产品的研制过程中,可靠性通常是增长的,因此这类数据符合可靠性增长指标要求。在设计可靠性指标验证方案时.充分地考虑了可靠性增长的信息,基于单调约束模型和Bogey试验设计方法,通过蒙特卡洛算法,给出一种可靠性增长验证统计方案的设计方法。

关 键 词:单凋约束模型  可靠性验证  Bogey试验

Design of Reliability Growth Demonstration Statiscs Plan
WEI Chuan,KANG Rui,WANG Wen-yu. Design of Reliability Growth Demonstration Statiscs Plan[J]. Electronic Product Reliability and Environmental Testing, 2013, 0(6): 28-31
Authors:WEI Chuan  KANG Rui  WANG Wen-yu
Affiliation:(School of Reliability and System Engineering, Beihang University, Beijing 100191, China)
Abstract:There is usually much information about a product in the development stage before the acceptance test. Reliability often grows during the development of the product, and the data meet the requirements for reliability growth parameters. In this paper, an approach for designing a demonstration statistics plan for reliability growth is presented using Monte Carlo algorithm based on monotone restriction model and the design of Bogey test, which takes aeeount of the reliability growth information for the design of demonstration for reliability parameters.
Keywords:monotone restriction model  reliability demonstration  Bogey testing
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