Enhanced suppression of superconductivity in amorphous films with nano-scale patterning

We have measured the thickness dependence of the superconducting critical temperature, T_c(d_Bi)$T_c(d_{\text{Bi}})$, in amorphous Bi/Sb films patterned with a regular array of holes as well as nanoscale thickness variations. We find that the mean field T_c$T_c$ is suppressed relative to simultaneously produced unstructured films of the same thickness. Surprisingly, however, the functional form for T_c(d_Bi)$T_c(d_{\text{Bi}})$, remains unaffected. The role of the thickness variations in suppressing T_c$T_c$ is compared to the role of the holes, through parameterization of the surface, as measured through AFM/SEM and a proximity effect calculation. These results suggest that these two nanoscale modifications suppress T_c$T_c$ about equally and are consistent with T_c$T_c$ being determined on a microscopic length scale.