首页 | 本学科首页   官方微博 | 高级检索  
     


Parameter selection for peak alignment in chromatographic sample profiling: objective quality indicators and use of control samples
Authors:Sonja Peters  Ewoud van Velzen  Hans-Gerd Janssen
Affiliation:(1) Advanced Measurement and Imaging, Unilever Research and Development, Unilever Food and Health Research Institute, P. O. Box 114, 3130 AC Vlaardingen, The Netherlands;(2) Polymer Analysis Group, van’t Hoff Institute for Molecular Sciences, University of Amsterdam, Nieuwe Achtergracht 166, 1018 WV Amsterdam, The Netherlands;(3) Biosystems Data Analysis, Swammerdam Institute for Life Sciences, University of Amsterdam, Nieuwe Achtergracht 166, 1018 WV Amsterdam, The Netherlands
Abstract:In chromatographic profiling applications, peak alignment is often essential as most chromatographic systems exhibit small peak shifts over time. When using currently available alignment algorithms, there are several parameters that determine the outcome of the alignment process. Selecting the optimum set of parameters, however, is not straightforward, and the quality of an alignment result is at least partly determined by subjective decisions. Here, we demonstrate a new strategy to objectively determine the quality of an alignment result. This strategy makes use of a set of control samples that are analysed both spiked and non-spiked. With this set, not only the system and the method can be checked but also the quality of the peak alignment can be evaluated. The developed strategy was tested on a representative metabolomics data set using three software packages, namely Markerlynx™, MZmine and MetAlign. The results indicate that the method was able to assess and define the quality of an alignment process without any subjective interference of the analyst, making the method a valuable contribution to the data handling process of chromatography-based metabolomics data.
Keywords:Chromatographic profiling  Metabolomics  Peak alignment  Quality control  Control samples
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号