| DC/DC模块中功率器件的寿命预计方法 |
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| 引用本文： | 黄春益,马卫东,张喆,谢雪松,吕长志,李志国. DC/DC模块中功率器件的寿命预计方法[J]. 微电子学, 2010, 40(2) |
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| 作者姓名： | 黄春益 马卫东 张喆 谢雪松 吕长志 李志国 |
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| 作者单位： | 北京工业大学,电子信息与控制工程学院,北京,100124 |
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| 摘 要： | 模拟开关电源DC/DC模块内部电路为开关电源中的功率器件—垂直导电双扩散MOS(VDMOS)和肖特基二极管(SBD)—提供恒定电应力,并对其施加温度应力进行加速寿命试验。采用恒定电应力温度斜坡法(CETRM),对开关电源中功率器件VDMOS和SBD的可靠性进行评价;对其失效机理一致性进行分析,计算其失效激活能;并在失效机理一致的范围内外推正常使用条件下的寿命,为开关电源整体可靠性评价提供依据。
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| 关 键 词： | 开关电源 DC/DC变换器 加速寿命试验 恒定电应力温度斜坡法 |
Power Device Lifetime Estimation in DC/DC Module |
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| HUANG Chunyi,MA Weidong,ZHANG Zhe,XIE Xuesong,LU Changzhi,LI Zhiguo. Power Device Lifetime Estimation in DC/DC Module[J]. Microelectronics, 2010, 40(2) |
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| Authors: | HUANG Chunyi MA Weidong ZHANG Zhe XIE Xuesong LU Changzhi LI Zhiguo |
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| Affiliation: | School of Electronic Information and Control Engineering/a>;Beijing University of Technology/a>;Beijing 100124/a>;P.R.China |
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| Abstract: | Internal circuit of DC/DC switching power supply module provides constant electronic stress for VDMOS and SBD.Accelerated life test was carried out by applying temperature stress.And reliability of power devices, VDMOS and SBD,was evaluated with constant electrical stress and temperature ramp stress method(CETRM). The consistency of its failure mechanism was analyzed,and activation energy was calculated.Lifetime of power devices under normal operation was estimated in the consistent range of failure mechani... |
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| Keywords: | Switching power supply Accelerated life test DC/DC converter CETRM |
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