| 宇航元器件极限评估试验剖面设计 |
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| 引用本文： | 毋俊玱,董宇亮,张小川,张洪伟.宇航元器件极限评估试验剖面设计[J].电子元件与材料,2012,31(1):59-63,67. |
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| 作者姓名： | 毋俊玱 董宇亮 张小川 张洪伟 |
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| 作者单位： | 1. 电子科技大学物理电子学院,四川成都61 0054
2. 中国空间技术研究院,北京,100029 |
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| 基金项目： | 中央高校基本科研业务费专项资金资助项目 |
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| 摘 要： | 宇航元器件极限评估是一种新的可靠性评价技术,其目的是评价电子元器件的极限能力,以适应航天对电子元器件的高可靠性要求。介绍了极限评估和极限评估试验,提出了极限评估试验剖面设计的一般原则,给出了试验剖面设计的典型方法,并以微波固态功放的温度应力极限评估试验和GaAs单片微波集成电路的电压应力极限评估试验作为典型样例设计了试验剖面,通过试验验证了剖面的有效性,最后总结了极限评估试验剖面设计中应当注意的一些事项。
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| 关 键 词： | 可靠性 极限评估 剖面 温度应力 电压应力 |
Screen design of aero-components' limit assessment test |
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| WU Junqiang,DONG Yuliang,ZHANG Xiaochuan,ZHANG Hongwei.Screen design of aero-components' limit assessment test[J].Electronic Components & Materials,2012,31(1):59-63,67. |
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| Authors: | WU Junqiang DONG Yuliang ZHANG Xiaochuan ZHANG Hongwei |
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| Institution: | 1.School of Physical Electronics,University of Electronic Science and Technology of China,Chengdu 610054,China;2.China Academy of Space Technology,Beijing 100029,China) |
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| Abstract: | Aero-components’ limit assessment,aiming at assessing the limit ability of electronic components in order to satisfy the high reliability requirement for aero-components,is a new technology for reliability evaluation.Limit assessment and limit assessment tests are introduced,and some general principles of screen design of limit assessment tests are proposed.Then the screens of two limit assessment tests are presented.The two tests,temperature stress limit assessment test of microwave solid power amplifiers and voltage stress limit assessment test of GaAs MMIC(Monolithic Microwave Integrated Circuit) are carried and proved the validity of the screens.The typical methods of screen design are also presented.Finally,some suggestions for the screen design of aero-components’ limit assessment tests are given. |
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| Keywords: | reliability limit assessment screen temperature stress voltage stress |
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