X‐ray Determination of Lattice Constants of CdXSn1‐XSe Mixed Crystal Systems

Cd_XSn_1‐XSe with x = 0, 0.25, 0.3, 0.5, 0.75 and 1 are synthesized by melt technique and are found to be polycrystalline in nature. The X‐ray powder diffraction data of polycrystalline Cd_XSn_1‐XSe with x = 0, 0.25, 0.3, 0.5, 0.75 and 1 are analysed at room temperature and reported. The XRD peaks are indexed using DICVOL91 and cell constants are refined using the software UNITCELL. The powder diffraction patterns, lattice parameters and other data describing these compounds are presented in this paper.