Thickness-dependent crystallization behavior of fast-growth phase-change amorphous films |
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| Authors: | JC Li M Li Q Jiang |
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| Institution: | a Key Laboratory of Automobile Materials of Ministry of Education, Jilin University, Changchun 130025, People's Republic of China
b Department of Materials Science and Engineering, Jilin University, Changchun 130025, People's Republic of China |
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| Abstract: | The crystallization behavior of amorphous films embedded in substrates with thickness of several nanometers is investigated based on a thermodynamic model. It is found that there is an optimum layer thickness where the crystallization speed of the films is maximized with the lowest energy barrier for crystallization. This is induced by an energetic change from glass/substrate interface energy to crystal/substrate interface energy as the crystal size is larger than the film thickness during the crystallization. Thus, the crystallization speed in thin films is affected by its thickness. |
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| Keywords: | Amorphous alloy Film Thickness Crystallization |
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