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Critical behavior of magnetic thin films
Authors:X.T. Pham Phu  H.T. Diep
Affiliation:a Laboratoire de Physique Théorique et Modélisation, Université de Cergy-Pontoise, CNRS, UMR 8089, 2, Avenue Adolphe Chauvin, 95302 Cergy-Pontoise Cedex, France
b Institute of Physics, P.O. Box 429, Bo Ho, Hanoi 10000, Viet Nam
c Asia Pacific Center for Theoretical Physics, Hogil Kim Memorial Building 5th floor, POSTECH, Hyoja-dong, Namgu, Pohang 790-784, Republic of Korea
Abstract:We study the critical behavior of magnetic thin films as a function of the film thickness. We use the ferromagnetic Ising model with the high-resolution multiple histogram Monte Carlo (MC) simulation. We show that though the 2D behavior remains dominant at small thicknesses, there is a systematic continuous deviation of the critical exponents from their 2D values. We explain these deviations using the concept of “effective” exponents suggested by Capehart and Fisher in a finite size analysis. The shift of the critical temperature with the film thickness obtained here by MC simulation is in an excellent agreement with their prediction.
Keywords:Ising model   Monte Carlo simulation   Equilibrium thermodynamics and statistical physics
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