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Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity |
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| Authors: | J. -M. Tonnerre E. Jal E. Bontempi N. Jaouen M. Elzo S. Grenier H. L. Meyerheim M. Przybylski |
| Affiliation: | 1.Institut Néel,CNRS et Université Joseph Fourier,Grenoble Cedex 9,France;2.Laboratorio di Chimica per le Tecnologie,Universita di Brescia,Brescia,Italy;3.L’Orme des Merisiers, Saint-Aubin,Synchrotron SOLEIL,Gif-sur-Yvette Cedex,France;4.Max-Planck-Institut für Mikrostrukturphysik,Halle,Germany |
| Abstract: | The analysis of complex magnetic profiles throughout an ultrathin magnetic films by soft X-ray resonant magnetic reflectivity is discussed. Subnanometer resolution can be achieved allowing the separation of interface and inner layer magnetic contributions as well as the determination of antiferromagnetic and non-collinear spin structures. Reflectivity measurements are carried out up to large scattering angles allowing the determination of the depth-resolved profiles of the out-of-plane magnetic component. |
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