首页 | 本学科首页   官方微博 | 高级检索  
     检索      

平面镜反射率的标定及修正
引用本文:孙可煦,张景和,崔明启,杨国洪,江少恩,易清,张文海,崔延莉.平面镜反射率的标定及修正[J].强激光与粒子束,2007,19(8):1308-1312.
作者姓名:孙可煦  张景和  崔明启  杨国洪  江少恩  易清  张文海  崔延莉
作者单位:中国工程物理研究院,激光聚变研究中心,高温高密度等离子体物理国家重点实验室,四川,绵阳,621900;哈尔滨工业大学,精密工程研究所,哈尔滨,150001;中国科学院,高能物理研究所,同步辐射实验室,北京,100039
基金项目:国家高技术研究发展计划(863计划)
摘    要: 研究了用同步辐射源标定软X光掠入射平面镜的反射率。实验采用北京同步辐射装置(BSRF)-3W1B束线及反射率计靶室,在50~1 500 eV能区,做了C,Si,Ni和Au材料平面镜在1°~7°掠射角下的反射率标定曲线。由于3W1B束线的单色器采用变间距光栅作色散元件,光栅分光必然存在高次谐波,高次谐波严重影响光源的单色性,从而给平面镜的反射率标定值带来误差。前置滤片虽然能有效抵制高次谐波,但不能完全消除高次谐波。为此,利用透射光栅对光源做了单色性研究,给出高次谐波在不同能区所占光源强度的比例,从而对平面镜反射率标定值做出修正。

关 键 词:同步辐射  软X光平面镜  反射率标定  数据处理  修正
文章编号:1001-4322(2007)08-1308-05
收稿时间:2006/9/8
修稿时间:2006-09-08

Calibration and correction of reflectivity of soft X-ray planar mirror
SUN Ke-xu,ZHANG Jing-he,CUI Ming-qi,YANG Guo-hong,JIANG Shao-en,YI Rong-qing,ZHANG Wen-hai,CUI Yan-li.Calibration and correction of reflectivity of soft X-ray planar mirror[J].High Power Laser and Particle Beams,2007,19(8):1308-1312.
Authors:SUN Ke-xu  ZHANG Jing-he  CUI Ming-qi  YANG Guo-hong  JIANG Shao-en  YI Rong-qing  ZHANG Wen-hai  CUI Yan-li
Institution:1. National Key Laboratery of Laser Fusion of Laser Fusion Research Center, CAEP, Mianyang 621900, China;2. Department of Fine Mechanical Engineering, Haerbin Institute of Technology, Haerbin 150001, China;3. Synchrotron Radiation Laboratory of Institute of High Energy Physics, Chinese Academy of Scineces, Beijing 100039, China
Abstract:The reflectivity calibration and correction of soft X-ray planar mirror is studied. Research is done on the 3W1B beamline of Beijing synchrotron radiation facility for mirrors with several materials, from 50 eV to 1 500 eV, with 40-120 mA beam current and 2 GeV storage ring electron energy. Variable-spacing planar grating on 3W1B generates higher harmonics necessarily, which reduces monochromaticity notably and brings about some errors. Though prefiher is used, limited by the grating dispersion effeciency and X-ray source internsity, there are still some higher harmonics during 300-750 eV. Therefore, the calibrated reflectivity must be corrected.
Keywords:Synchrotron radiation  Soft X-ray  Planar mirror  Reflectivity calibration  Correction
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《强激光与粒子束》浏览原始摘要信息
点击此处可从《强激光与粒子束》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号