Optical characterization of the recombination process in silicon wafers, epilayers and devices |
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| Authors: | Andrea Irace Luigi Sirleto Paolo Spirito Giovanni F. Vitale Antonello Cutolo S. Campopiano Luigi Zeni |
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| Affiliation: | a Department of Electronic and Telecommunication Engineering, University of Naples “Federico II”, Via Claudio 21, 1-80125, Naples, Italy;b Università del Sannio, Benevento, Italy;c Department of Information Engineering, Second University of Naples, Aversa, Italy |
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| Abstract: | In this paper we present various approaches to the measurement of recombinative parameters in silicon wafers, epitaxial layers and solar cells. In particular our techniques are able to measure the bulk lifetime and the surface recombination velocity at low injection levels. We also show that the techniques presented are a reliable tool to monitor the fabrication process of a standard crystalline silicon solar cell. In all the methodologies presented there are no stringent requirements concerning the state of wafer surface. |
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