Ion chromatographic analysis of anions in ammonium hydroxide,hydrofluoric acid,and slurries,used in semiconductor processing |
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Authors: | Wang Kefei Lei Yun Eitel Mark Tan Samantha |
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Affiliation: | ChemTrace Corp, Fremont, CA 94538, USA. kefei_wang@chemtrace.com |
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Abstract: | In this study, ion chromatography (IC) with suppressed conductivity detection was used for the determination of trace anions in 29% (w/w) ammonium hydroxide, 49% (w/w) hydrofluoric acid and slurries. For these samples, various sample pretreatment methods were applied to eliminate matrix interferences. For concentrated ammonium hydroxide, an on-line electrochemical neutralizer (SP10 AutoNeutralization module) was used to neutralize the base prior to the IC analysis. For concentrated hydrofluoric acid, a heart cutting technique with an ion-exclusion column was used to separate the anions of interest prior to an IC separation. A method was also developed to analyze chloride in silica slurries by IC. |
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