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Structural study of (As2S3)0.6(GeS2)0.4 glass |
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| Authors: | T Kavetskyy O Shpotyuk I Kaban W Hoyer J Filipecki M Iovu |
| Institution: | aScientific Research Company “Carat”, 202 Stryjska Str., 79031 Lviv, Ukraine;bSolid State Microelectronics Laboratory, 24 I. Franko Str., 82100 Drohobych, Ukraine;cJan Dlugosz University, 13/15 Al. Armii Krajowej, 42201 Czestochowa, Poland;dInstitute of Physics, Chemnitz University of Technology, D-09107 Chemnitz, Germany;eCenter of Optoelectronics, 1 Academiei Str., MD-2028 Chisinau, Republic of Moldova |
| Abstract: | (As2S3)0.6(GeS2)0.4 glass in non-irradiated and γ-irradiated states has been studied by using high-energy synchrotron X-ray diffraction, extended X-ray absorption fine structure spectroscopy, and positron annihilation lifetime spectroscopy. The experimental results are explained by the local changes around As and Ge atoms upon irradiation. These changes are suggested to involve chemical bonds distortion, formation of defective bonds with wrong coordination, rotation of structural units and appearance of additional free volume in the glass network. |
| Keywords: | Synchrotron radiation X-ray diffraction Radiation effects Infrared glasses Chalcogenides Positron annihilation Radiation Defects Medium-range order Short-range order First sharp diffraction peak |
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