Femtosecond first-order autocorrelation measurement based one-photon induced photocurrent in Si Schottky diodes

Si Schottky diodes promise to provide cheap, reliable, and linear detectors for use in femtosecond and picosecond pulse width measurement. At low pulse excitation density (<100 pJ/cm²), the pulse width can be deduced from the first-order autocorrelation, and the measured results are in agreement with the theoretical ones. When pulse excitation density is larger than 1 nJ/cm², the pulse trailing edge is distorted due to bandgap reduction in semiconductor Si and the pulse width cannot be measured accurately by means of the first-order autocorrelation. The interference fringes presented in the first-order autocorrelation measurement can provide a way of calibrating the delay, and the pulse width can also be obtained by calculating the number of interference fringes.