Fractal signature methods for profiling of processed surfaces

A new approach to surface profiling of structural materials that evolves from the concept of fractal signature is put forward. This approach has been developed and advantageously applied for acquisition of low-contrast targets. It is based on the fractal theory, and fractal signatures and fractal dimensions (which are intimately related to both the object’s topology and evolutionary processes in dynamic systems) are used as estimating parameters. The experimental data obtained prove the existence of fractal clusters on the processed surface microrelief. Quantitative characterization of these clusters is given.