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Surface functionalization with phosphazene substrates—part VII. Silicon‐based materials functionalized with hexachlorocyclophosphazene
Authors:Angelo Boscolo Boscoletto  Mario Gleria  Roberto Milani  Laura Meda  Roberta Bertani
Affiliation:1. Polimeri Europa, Tecnologia Olefine e Aromatici, Via della Chimica 5, 30175 Porto Marghera, Venezia, Italy;2. Dipartimento di Processi Chimici dell'Ingegneria, via F. Marzolo 9, 35131 Padova, Italy;3. Dipartimento di Scienze Chimiche dell'Università, Via F. Marzolo 1, 35131 Padova, Italy;4. ENI SpA‐ Divisione Refining and Marketing, Centro Ricerche Novara, Via G. Fauser 4, 28100 Novara, Italy
Abstract:This paper investigates by means of XPS analysis the surface functionalization of soda‐lime and fused quartz glass substrates with hexachlorocyclophosphazene (HCCP), obtained by simple immersion in solutions of phosphazene in anhydrous solvents. Several experimental parameters like reaction solvent, temperature and treatment duration were studied, together with the influence of physisorbed water on the surface of the substrates. Phosphazene‐derived deposits resistant to tetrahydrofuran (THF) washing and vacuum drying were obtained. They presented P:N:Cl stoichiometric ratios close to 1:1:1 when the reaction and the final drying of the samples were performed at room temperature; use of higher temperatures resulted in lower nitrogen and chlorine content. The chemical nature of the films was studied by XPS peaks deconvolution which enabled us to propose a possible, temperature‐enhanced hydrolytical degradation mechanism. Copyright © 2008 John Wiley & Sons, Ltd.
Keywords:surface functionalization  phosphazenes  silica  soda‐lime glass  XPS
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