| Abstract: | The use of anodic stripping voltammetry for quantitative analytical measurements using solid electrodes is addressed in the light of generic limitations arising from i) electrode heterogeneity, ii) electrode morphology, iii) inhibited electrodeposition, and iv) incomplete stripping of deposited metal in the anodic sweep. It is shown, using direct imaging of electrode surfaces via AFM and optical microscopy, that each of the preceding factors may produce significant deviations from ideal electrode behavior. The use of atomic force microscopy to fully characterize any developed ASV procedures is strongly recommended. To ensure reproducible and accurate stripping voltammetry, steps should be taken to minimize the effects discussed. |
