A thin-film transistor with a very thin a-Si:H layer and its application for an LC panel |
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Authors: | H. Tanaka T. Sakai M. Shimbo S. Arai T. Yamazaki |
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Affiliation: | (1) Research and Development Department, Seiko Instruments and Electronics Ltd., 563, Takatsukashinden, Matsudo-shi, 271 Chiba, Japan |
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Abstract: | One of the disadvantages of applying an a-Si:H thin-film transistor (TFT) to an active matrix-addressed liquid crystal (LC) panel is that a TFT with an a-Si:H has a very large photo-leakage current because of the high photo-conductivity of an a-Si:H itself.We have tried decreasing the photo-leakage current by varying the thickness of an a-Si:H layer (L) in TFTs and investigated the characteristics of TFTs, mainly drain voltage versus drain current containing photo-leakage current (Iph).As a result, it is shown that lnIph is proportional to InL, and its gradient is 1.5–2.0. We assume that the thinner an a-Si:H layer is, the more effective the recombination of carriers at the interface states is forIph.We have applied TFT with a very thin a-Si:H layer (30nm) to a full-color active matrix-addressed LC panel for a moving picture display and realized a display of good quality under illuminated condition of 5×104lx without a shading layer in it. |
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Keywords: | 73.40.Qv 73.60.Fw 86.60.Pg |
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