Characteristics of selective oxidation during the fabrication of vertical cavity surface emitting laser |
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Authors: | Hao Yong-Qin Zhong Jing-Chang Ma Jian-Li Zhang Yong-Ming Wang Li-Jun |
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Affiliation: | National Key Lab of High-Power Semiconductor Lasers,Changchun University of Science and Technology, Changchun 130022, China; Material & Engineering College, Shenyang Institute of Chemical Technology, Shenyang 110142, China; Changchun Institute of Optics, Fine Mechanics and Physics, Changchun 130033, China |
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Abstract: | Taking into account oxidation temperature, N2 carrier gas flow, and thegeometry of the mesa structures this paper investigates the characteristics ofselective oxidation during the fabrication of the vertical cavity surface emittinglaser (VCSEL) in detail. Results show that the selective oxidation follows alaw which differs from any reported in the literature. Below 435℃selective oxidation of Al0.98Ga0.02As follows a linear growth law for thetwo mesa structures employed in VCSEL. Above 435℃ approximately increasingparabolic growth is found, which is influenced by the geometry of the mesastructures. Theoretical analysis on the difference between the two structures forthe initial oxidation has been performed, which demonstrates that the geometry ofthe mesa structures does influence on the growth rate of oxide at highertemperatures. |
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Keywords: | laser technique selective oxidation vertical-cavity surface-emitting laser quantum-well semiconductor laser |
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