| 制备工艺对电子俘获材料性能的影响 |
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| 引用本文： | 范文慧 刘英. 制备工艺对电子俘获材料性能的影响[J]. 光子学报, 1998, 27(9): 855-859 |
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| 作者姓名： | 范文慧 刘英 |
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| 作者单位： | 西安交通大学理学院现代物理研究所，中国科学院西安光学精密机械研究所 |
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| 摘 要： | 利用等离子体质谱(ICP-MS)技术测试了硫化助熔剂法和稀土直接掺杂工艺合成电子俘获材料的化学计量比,结果表明,采用稀土直接掺杂工艺合成材料的化学计量比更接近设计值;通过分析电子俘获材料的发光机制和光谱测试结果,讨论了制备工艺条件对电子俘获材料中稀土离子化合价的影响.
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| 关 键 词： | 电子俘获材料 硫化助熔剂法 稀土直接掺杂工艺 等离子体质谱 |
| 收稿时间： | 1998-03-11 |
PROPERTIES OF ELECTRON TRAPPING MATERIALS INFLUENCED BY THE SYNTHESIZING CONDITIONS |
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| Fan Wenhui,Liu Ying,Wang Yongchang,Guo Xiaohui,Zhang Dawei,Hou Xun . PROPERTIES OF ELECTRON TRAPPING MATERIALS INFLUENCED BY THE SYNTHESIZING CONDITIONS[J]. Acta Photonica Sinica, 1998, 27(9): 855-859 |
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| Authors: | Fan Wenhui Liu Ying Wang Yongchang Guo Xiaohui Zhang Dawei Hou Xun |
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| Affiliation: | 1. Institute of Modern Physics, School of Science, Xi′an Jiaotong University, Xi′an 710049;2. Xi′an Institute of Optics and Precision Mechanics, The Chinese Academy of Science, xi′an 710068 |
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| Abstract: | Stoichiometry of the major activators in electron trapping materials (ETM),prepared by sulfurizing flux method (SFM) and the rare earth direct doped technique,is measured by means of the induction coupled plasma mass spectrum (ICP-MS).It is shown that the rare earth direct doped technique is better than SFM.Influenced by the synthesizing conditions,the variation of valence state of the main activators,such as Eu in Cas:Eu,Sm,is discussed by analyzing the charge trapping mechanism and spectra of ETM. |
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| Keywords: | Electron trapping material Sulfurizing flux method Rare earth direct doped technique ICP MS |
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