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Polyvinyl- and polyphenylsilsesquioxanes and their films: an investigation by X-ray diffractometry, positron diagnostics, and 29Si NMR spectroscopy |
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| Authors: | N P Shapkin Yu N Kul??chin V I Razov S S Voznesenskii V V Bazhenov M V Tutov N N Stavnistyi V G Kuryavyi A B Slobodyuk |
| Institution: | 1. School of Natural Science, Far Eastern Federal University, 8 ul. Sukhanova, 690950, Vladivostok, Russian Federation 2. Institute of Automation and Control Processes, Far Eastern Branch of the Russian Academy of Sciences, 5 ul. Radio, 690041, Vladivostok, Russian Federation 3. Institute of Chemistry, Far Eastern Branch of the Russian Academy of Sciences, 159 prosp. 100-letiya Vladivostoka, 690022, Vladivostok, Russian Federation |
| Abstract: | Polyvinyl- and polyphenylsilsesquioxanes (RSiO1,5) n were synthesized by hydrolytic polycondensation. The cross section surface areas of the polymer chain were measured and the sizes of ??traps?? of the free and ordered volumes and the ratio of the T2 and T3 units in (RSiO1,5) n were determined by time positron diagnostics, 29Si NMR spectroscopy, and X-ray diffractometry. The density of polyvinyl- and polyphenylsilsesquioxanes was determined picnometrically and from the X-ray phase analysis data, and the content of hydroxyl groups was found by thermogravimetry. The cross section surface area of the silsesquioxane chains containing vinyl and phenyl radicals at Si were calculated by the Miller-Boyer method. The elementary volumes of the chain segments determined by different methods were compared. The geometric models for ??traps?? of the free volume were proposed. The optical properties and morphology of the polyvinylsilsesquioxane films were studied by atomic force microscopy and UV spectroscopy. |
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