首页 | 本学科首页   官方微博 | 高级检索  
     检索      

采用数字辅助直流失调消除技术适用于WCDMA/GSM接收机的双模模拟基带
引用本文:谢任重,江晨,李伟男,黄煜梅,洪志良.采用数字辅助直流失调消除技术适用于WCDMA/GSM接收机的双模模拟基带[J].半导体学报,2011,32(12):125001-6.
作者姓名:谢任重  江晨  李伟男  黄煜梅  洪志良
基金项目:Project supported by the National High Technology Research and Development Program of China (Nos. 2009AA01 Z261, 2009ZX01031- 003-002).
摘    要:A dual-mode analog baseband with digital-assisted DC-offset calibration (DCOC) for WCDMA/GSM receiver is presented. A digital-assisted DCOC is proposed to solve the DC-offset problem by removing the DC-offset component only. This method has no bandwidth sacrifice. After calibration the measured output residual offset voltage is within 5 mV at most gain settings and the IIP2 is more than 60 dBm. The baseband is designed to be reconfigurable at bandwidths of 200 kHz and 2.1 MHz. Total baseband gain can be programmed from 6 to 54 dB. The chip is manufactured with 0.13 μm CMOS technology and consumes 10 mA from a 1.5 V supply in the GSM mode including an on-chip buffer while the core area occupies 1.2 mm2.

关 键 词:WCDMA  直流偏移  GSM  双模式  接收机  基带  校准  模拟
收稿时间:6/13/2011 7:41:02 PM
修稿时间:7/12/2011 8:21:09 PM

A dual-mode analog baseband with digital-assisted DC-offset calibration for WCDMA/GSM receivers
Xie Renzhong,Jiang Chen,Li Weinan,Huang Yumei and Hong Zhiliang.A dual-mode analog baseband with digital-assisted DC-offset calibration for WCDMA/GSM receivers[J].Chinese Journal of Semiconductors,2011,32(12):125001-6.
Authors:Xie Renzhong  Jiang Chen  Li Weinan  Huang Yumei and Hong Zhiliang
Institution:State Key Laboratory of ASIC and System, Fudan University, Shanghai 201203, China;State Key Laboratory of ASIC and System, Fudan University, Shanghai 201203, China;State Key Laboratory of ASIC and System, Fudan University, Shanghai 201203, China;State Key Laboratory of ASIC and System, Fudan University, Shanghai 201203, China;State Key Laboratory of ASIC and System, Fudan University, Shanghai 201203, China
Abstract:
Keywords:analog baseband  digital-assisted DCOC  reconfigurable  receiver
本文献已被 维普 等数据库收录!
点击此处可从《半导体学报》浏览原始摘要信息
点击此处可从《半导体学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号