| 光学元件干涉检测数据的定位处理方法 |
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| 引用本文： | 陈伟. 光学元件干涉检测数据的定位处理方法[J]. 光子学报, 2011, 0(8): 1191-1195 |
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| 作者姓名： | 陈伟 |
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| 作者单位： | 西安科技大学通信与信息工程学院; |
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| 基金项目： | 陕西省教育厅专项(No.09JK566)资助 |
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| 摘 要： | 在光学元件的抛光阶段,通常采用干涉仪对光学元件的面形数据进行检测,为进一步的加工工作提供指导意见.为了利用干涉仪检测数据给出被测光学元件面形上的各点空间坐标准确位置,对面形数据的原始数据做二值化处理,用Sobel算子采用基于边缘检测的方法准确提取光学元件的外形轮廓数据,采用基于半径约束的最小二乘拟合方法对被测光学元件的...
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| 关 键 词： | 光学检测 数控加工 边缘检测 随机误差 |
Interferogram Processing Method of Optical Surfaces |
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| CHEN Wei. Interferogram Processing Method of Optical Surfaces[J]. Acta Photonica Sinica, 2011, 0(8): 1191-1195 |
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| Authors: | CHEN Wei |
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| Abstract: | Interferometers are used to test the surface shape data of optical component for further processing to provide guidance.Various spatial point on the tested optical component are given by interferogram analysis.The binary image is get from the raw data,then the edge of optical component is differentiated with a sobel exactly.A coefficient constraint condition is incorporated into the least squares method for geometric parameters of circles,and the location of the centre of the circle and the size of the radi... |
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| Keywords: | Optical test Computer control optical surface Edge detectiion Random error |
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