Optically induced transverse voltages in thin metal films

Results of experiments on laser induced voltages in metal films are summarized. The voltages are found to occur along certain directions in the plane of slant-angle vapour deposited films. A thermo-electric model based on periodic variations in the microscopic film structure, is described. The magnitude of the effect is proportional to the absorbed power/length between the contact points. Application of the films in the wavelength range 0.33–10.6μm is described and compared to more conventional detectors. A recent application, using the effect as a tool to profile non-uniformities in thin films, is also discussed.