Resonant Rayleigh scattering from excitons in CdxZn1−xTe:ZnTe quantum wells: measurement of homogeneous linewidths

The technique of resonant Rayleigh scattering is used to determine the homogeneous linewidth across the inhomogeneously broadened exciton resonance in a Cd_0.25Zn_0.75Te/ZnTe multiple quantum well structure. An order of magnitude increase of the Rayleigh scattering signal over background is observed on tuning a narrow-band laser through the exciton resonance at low temperatures. Spectral and temporal measurements show the effect to be a true scattering process rather than luminescence. The interface and alloy fluctuations in the quantum well give rise to spatial fluctuations in the dielectric response of the system while the large exciton resonance causes strong enhancement of scattering. The homogeneous linewidth was calculated across the exciton resonance. The technique is compared with the dephasing and hole-burning techniques more commonly used in homogeneous linewidth measurements.