| ACTFEL器件加速寿命试验方法的讨论 |
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| 引用本文： | 田祥 谢相伟. ACTFEL器件加速寿命试验方法的讨论[J]. 光电子技术, 1993, 13(4): 36-40 |
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| 作者姓名： | 田祥 谢相伟 |
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| 作者单位： | 南京电子器件研究所 210016 |
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| 摘 要： | 就ACTFEL器件加速寿命试验采用的高频加速试验方法及加速因子的选择进行了探讨。认为:在每周期传输电荷保持一致的条件下,加速因子(β)等于高频相对于低频的倍数。
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| 关 键 词： | 电致发光 寿命试验 ACTFEL器件 |
Discussion on Accelerated Aging Tests for ACTFEL Devices |
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| Tian Xiang Xie Xiangwei. Discussion on Accelerated Aging Tests for ACTFEL Devices[J]. Optoelectronic Technology, 1993, 13(4): 36-40 |
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| Authors: | Tian Xiang Xie Xiangwei |
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| Abstract: | The methods for the accelerated aging test and choice of acceleration factor are discussed. An acknowledgement is given that keeping the transfered charge in each polarity consistent,the acceleration proportion factor of high frequency to normal frequency is obtained. |
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| Keywords: | electroluminescence accelerated aging test acceleration factor |
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