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脉宽对中红外激光带内损伤HgCdTe材料的影响
引用本文:胡蔚敏,王小军,田昌勇,杨晶,刘可,彭钦军.脉宽对中红外激光带内损伤HgCdTe材料的影响[J].强激光与粒子束,2022,34(1):011009-1-011009-8.
作者姓名:胡蔚敏  王小军  田昌勇  杨晶  刘可  彭钦军
作者单位:1.中国科学院 理化技术研究所 固体激光重点实验室, 北京 100190
基金项目:国家自然科学基金青年科学基金项目(61805259);中国科学院固体激光重点实验室基金项目。
摘    要:研究了脉宽对于中红外脉冲激光带内损伤碲镉汞(HgCdTe)材料阈值的影响,使用一维自洽模型对激光辐照HgCdTe材料程中的载流子数密度,载流子对数目流,载流子对能流,载流子温度和材料晶格温度等相关参数进行仿真计算。仿真结果表明,波长2.85 μm,脉宽30 ps~10 ns单脉冲激光带内辐照HgCdTe材料的损伤阈值为200~500 mJ/cm2。其中,300 ps~3 ns脉冲激光的损伤阈值相近,均为200 mJ/cm2且低于其他脉宽激光的损伤阈值。搭建实验光路并进行相关实验验证仿真模型的正确性。实验发现,波长2.85 μm、脉宽300 ps的单脉冲激光带内辐照HgCdTe材料的损伤阈值在200 mJ/cm2左右。相同条件下,10 ns单脉冲激光带内辐照HgCdTe材料的损伤阈值约474 mJ/cm2。百皮秒脉冲激光对HgCdTe材料的损伤过程结合了热击穿和光学击穿效应,其独特的毁伤机理加剧了材料的损伤。

关 键 词:激光辐照半导体    碲镉汞    损伤阈值    自洽模型    百皮秒脉冲激光
收稿时间:2021-07-26

Influence of mid-infrared laser pulse width on in-band damage threshold of HgCdTe
Hu Weimin,Wang Xiaojun,Tian Changyong,Yang Jing,Liu Ke,Peng Qinjun.Influence of mid-infrared laser pulse width on in-band damage threshold of HgCdTe[J].High Power Laser and Particle Beams,2022,34(1):011009-1-011009-8.
Authors:Hu Weimin  Wang Xiaojun  Tian Changyong  Yang Jing  Liu Ke  Peng Qinjun
Institution:1.Key Laboratory of Solid State Lasers, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing 100190, China2.Key Laboratory of Functional Crystals and Laser Technology, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing 100190, China3.University of Chinese Academy of Sciences, Beijing 100049, China
Abstract:To study the influence of pulse width on the damage threshold of HgCdTe material irradiated by mid-infrared in-band laser pulse, a one-dimensional model named self-consistent model is established. Some parameters including number density of carrier, carrier and energy current, temperature of carrier and lattice are calculated in the whole process. Damage thresholds of in-band single pulsed laser, whose wavelength is 2.85 μm and pulse width ranges from 30 ps to 10 ns, are obtained. The results show that, damage threshold rauge of in-band laser is 200?500 mJ/cm2. Among them, the damage threshold of 300 ps to 3 ns laser pulses is about 200 mJ/cm2, which is lower than that of other pulsed lasers. The validity of simulation model is verified by setting up the experimental devices and carrying out relevant experiments. Using a single pulsed laser with wavelength of 2.85 μm and pulse width of 300 ps as the light source, the damage threshold is about 200 mJ/cm2. Under the same conditions, when 10 ns single laser pulse is used, the damage threshold is greater than 474 mJ/cm2. The damage process of the HgCdTe material destroyed by hundred-picosecond pulsed laser combines thermal and optical breakdown effects, and its unique mechanism aggravates the destruction of material.
Keywords:laser radiation semiconductor  HgCdTe  damage threshold  self-consistent model  hundredpicosecond pulsed laser
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