(1) Institut für Spektrochemie und angewandte Spektroskopie, Postfach 101352, D-4600 Dortmund 1, Germany
Abstract:
Diffuse reflectance of strongly absorbing sample layers is calculated in dependence of their thicknesses from the Kubelka-Munk theory. The results are compared to experimental ones from varnish layers on reflecting metal substrates.