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Sampling depth in infrared diffuse reflection spectroscopy of undiluted samples
Authors:Andreas Otto  Ernst-Heiner Körte
Affiliation:(1) Institut für Spektrochemie und angewandte Spektroskopie, Postfach 101352, D-4600 Dortmund 1, Germany
Abstract:Diffuse reflectance of strongly absorbing sample layers is calculated in dependence of their thicknesses from the Kubelka-Munk theory. The results are compared to experimental ones from varnish layers on reflecting metal substrates.
Keywords:infrared spectroscopy  diffuse reflectance  Kubelka-Munk theory  sampling depth  varnishes
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