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Ion synthesis and optical properties of gold nanoparticles in an Al2O3 matrix
Authors:A. L. Stepanov  C. Marques  E. Alves  R. C. da Silva  M. R. Silva  R. A. Ganeev  A. I. Ryasnyansky  T. Usmanov
Affiliation:1. Institute of Experimental Physics, Erwin Schr?dinger Institute for Nanoscale Research, Karl-Franzens University, A-8010, Graz, Austria
2. Zavo?ski? Physicotechnical Institute, Kazan Scientific Center, Russian Academy of Sciences, Sibirski? trakt 10/7, Kazan 29, 420029, Tatarstan, Russia
3. Department Física, Instituto Technólogico e Nuclear, E.N. 10, 2695-953, Sacavém, Portugal
4. CFN da, Universidade de Lisboa, 1649-003, Lisboa, Portugal
5. Akadempribor Research and Production Association, National Academy of Sciences of Uzbekistan, Tashkent, 700125, Uzbekistan
6. Institute of Solid State Physics, Tokyo University, Kashiva, 277-8581, Chiba, Japan
7. Navoi State University, Samarkand, 703004, Uzbekistan
8. Institut des Nano-Sciences de Paris, CNRS-Université Pierre et Marie Curie, Case 80, F75015, Paris, France
Abstract:Single-crystal Al2O3(0001) and Al2O3(1120) substrates are implanted by 160-keV Au+ ions with doses from 1015 to 1017 cm?2. Some of the implanted samples are air-annealed at 800–1200°C. The properties of the synthesized composite layers are studied by Rutherford backscattering and linear optical reflection measurements, and their nonlinear optical characteristics are examined by RZ-scanning using a picosecond Nd: YAG laser operating at a wavelength of 1064 nm. The Rutherford backscattering spectra indicate that the implanted impurity concentrates near the surface of the Al2O3. The formation of gold nanoparticles in the Al2O3 can be judged from the characteristic optical plasmon resonance band in the reflectance spectra of the samples irradiated to a dose higher than 6.0 × 1016 cm?2. The synthesized particles are shown to be responsible for nonlinear optical refraction in the samples. The nonlinear refractive index, n 2, and the real part of the third-order susceptibility, Rex(3), of the composite layers are determined.
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