Quantitative characterization of individual particle surfaces by fractal analysis of scanning electron microscope images |
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| Authors: | Annick Van Put, Akos Vertes, Darek Wegrzynek, Boris Treiger René Van Grieken |
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| Affiliation: | (1) Department of Chemistry, University of Antwerp (UIA), B-2610 Antwerp-Wilrijk, Belgium;(2) Institute of Physics and Nuclear Techniques, Academy of Mining and Metallurgy, PL-30059 Krakow, Poland;(3) Present address: Department of Chemistry, George Washington University, 20052 Washington, DC, USA |
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| Abstract: | Morphological characterization of individual particle surfaces was explored by off-line image processing of data obtained by scanning electron microscope — microanalyzer. The fractal geometry was studied by two methods, the power spectrum and the variogram approach. Both methods were evaluated, theoretically by a series of numerically simulated surface profiles and experimentally on a set of pre-recorded secondary electron images of particle surfaces exposing characteristic textures. It was shown that the fractal approach could stand as a base of the methods enlarging the application of electron probe X-ray microanalyzers for individual particle characterization.Dedicated to Professor Dr. Dieter Klockow on the occasion of his 60th birthdayOn leave from: State Pedagogical Institute, Kirovograd, Ukraine |
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