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光波强衰场悬浮颗粒检测中的显微摄像术
引用本文:王晓,刘小青.光波强衰场悬浮颗粒检测中的显微摄像术[J].激光技术,1998,22(2):69-73.
作者姓名:王晓  刘小青
作者单位:1.国防科技大学204教研室, 长沙, 410073
摘    要:被烟尘、粉末、水雾等充斥的空间对光波有极强的衰减作用,统称为强衰场。普通的摄像技术不可能从此类强衰场中获取清晰的图像。融合了显微光学原理和CCD摄像技术的显微摄像术与相应的技术手段配合,可以摄取强衰场中悬浮颗粒的放大图像,并实现远距离传输和多用户监测,从而为强衰场悬浮颗粒检测实践了一条新思路。

关 键 词:强衰场    显微光学    CCD摄像    显微摄像术
收稿时间:1996-10-26

Application of image pick up microscopy for measurement of passive disturbing materials in photoelectric countermeasure
Wang Xiao,Liu Xiaoqing.Application of image pick up microscopy for measurement of passive disturbing materials in photoelectric countermeasure[J].Laser Technology,1998,22(2):69-73.
Authors:Wang Xiao  Liu Xiaoqing
Abstract:When a light beam goes through the space flooded with passive disturbing materials,such as heavy smog,water fog,aerosol etc.,the light wave will be greatly attenuated.We call the space the strong attenuation field.Our aim is to get the information of the small grains of 0.001mm size,but a conventional vedio camera can not take the clear pictures of the grains of the disturbing materials from the field,and can not provide the information about the parameters of single grain and the statistical characteristics of the group of the grains.In our system,the combination of CCD display technique and a special optical system named image pick up microscopy,like the optical system of a microscope,is used to enlarge the image of the gain in the field.Then the picture can be transmitted over a long distance to process and to obtain the information of the characteristics of the grains.In this paper,the aberration of the optical system and manufacturing tolerance of the optical system have been analyzed.This is a new method to measure the passive disturbing materials in photoelectric countermeasure.
Keywords:strong  attenuation  field  microoptics  CCD  image  display  technique  microscopy    image  technique  
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