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Probabilistic fault grading based on activation checking and observability analysis
Authors:Masahisa Nakazawa  Susumu Nitta  Kanji Hirabayashi
Institution:(1) VLSI Research Center, TOSHIBA Corporation, 1 Komukai-Toshiba, 210 Kawasaki, Japan
Abstract:A simplified probabilistic fault grading method is described. The concept of propagation probability is introduced in place of the sensitization probability of STAFAN, and the empirical parameters of STAFAN are eliminated. The division of input vectors into subsets is monitored by the activation or toggle rate. The accuracy of the method is examined for fault coverage estimation and for predicting the undetected faults.
Keywords:activation checking  controllability  detectability  fault-free simulation  fault grading  observability  statistical fault analysis
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