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On the theory of sublinear current-voltage characteristics of semiconductor structures
Authors:A.Yu. Leiderman  P.M. Karageorgy-Alkalaev
Affiliation:Institute of Thechnical Physics, Academy of Sciences of the Uzbek SSR, Tashkent, USSR
Abstract:The strong carrier accumulation in the high resistive region of semiconductor structures giving rise to field-opposed diffusion of free carriers may result in the appearance of the sublinear current-voltage dependence [V ∝ exp (Iaw)], which is extremely sensitive on external influences.
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